Discovery Summit China Dots header background

China 2021

July 8 - July 10

Thursday - Saturday

13:30 - 15:40 each day

Agenda

Thursday, July 8

13:00-13:35

Opening Remarks

13:35-14:15

Unisoc: Exploration of Engineering Data Analysis Platform for Advanced Semiconductor Manufacturing System

Zhinong Liu, Chief Supply Line, Senior Vice President, Unisoc 

14:15-14:55

Digital System Transformation Driven by JMP® Under Industry 4.0

Peter Wang,  AT&S

14:55-15:35

Using JMP® to Resolve Problems in Semiconductor Industry

Hans Zhang, Senior Wire Bond Process Leader and Six Sigma Manager, Master Black Belt, NXP Semiconductor (China) Limited

15:35-15:40

Closing Remarks

Friday, July 9

13:30-13:35 

Opening Remarks

13:35-14:15 

Finding the Golden Curve: An Introduction to Functional Response Designed Experiments

Christopher Gotwalt, JMP Chief Data Scientist, SAS

14:15-14:55

Using JMP® Custom Designs to Achieve Rapid Product Optimization: Case Studies From the Cosmetics Industry 

Lina Zhao, Statistician Manager, Loreal R&I Japan

14:55-15:35

The New JMP® 16 Limits of Detection in Design of Experiments and Data Analysis

Laura A. Higgins, JMP Senior Systems Engineer, SAS

15:35-15:40

Closing Remarks

Saturday, July 10

13:30-13:35 

Opening Remarks

13:35-14:15 

Data Analysis Boosts Product Development Efficiency and Process Optimization in the Steel Industry

Jiandong Guan, Director of Product Research Office, Chief Engineer, Qianxun Technology Center, Shougang Steel

14:15-14:55

How to Improve Forecast Accuracy: Forecast Post-Sales Failure With Seasonal ARIMA

Xuhui Du, TUV Registered Six Sigma Black Belt, Senior Engineer & Internal Trainer, Quality Department, KOSTAL Asia

14:55-15:35

Overview of JMP® Reliability Platforms

Peng Liu, JMP Principal Research Statistician Developer, SAS

15:35-15:40

Closing Remarks

Back to Top