Online Agenda
Tuesday, 10 March
13:00 - 16:30 CET
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Session ID: 2020-EU-TUT-529
Introduction to JMP® Live: Use and Administration
Brian Corcoran, JMP Director of Research and Development, SAS
Dieter Pisot, JMP Principal System Engineer, SAS
Eric Hill, JMP Distinguished Software Developer, SAS
Wednesday, 11 March
11:00 - 11:45 CET
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Digital Analytics Boosted With JMP® Integration to Google Cloud
Alfredo López Navarro, Data Lab Manager, Telefónica
Arne Ruhkamp, Senior Digital Analyst, Telefónica
11:50 - 12:20 CET
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See Fer Yer Sen: The Importance of Data Exploration, a JMP Live Showcase
Phil Kay, JMP Senior Systems Engineer, SAS
12:30 - 13:15 CET
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Optimization of a Chemical Looping Process by Optimal DOE and Statistical Modeling
Frank Deruyck, Lecturer, University College Ghent
13:20 - 13:50 CET
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Biological Products and Stability: Linear and Nonlinear Modeling
Thomas Brisset, Stability Platform Manager, Stallergenes Greer
14:00 - 14:45 CET
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Pictures From the Gallery 5: Select Advanced Graph Builder Views
Scott Wise, Senior Manager, Analytical Education, SAS
15:00 - 16:00 CET
Plenary
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JMP® 15: Instant Graphical Gratification
John Sall, SAS
Thursday, 12 March
11:00 - 11:30 CET
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SIFTomics and Data Analytics: The Quickest Way to Unravel the Totality of Your Chemical Space
Camilla Liscio, Senior Application Chemist, Anatune
Jamie Minaeian, Application Chemist, Anatune
11:35 - 12:05 CET
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Using Simulation Methods in JMP® to Prevent Supply Chain Fires
Stephen Pearson, Specialist Data Scientist, Syngenta
12:15 - 12:45 CET
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Data Exploration and Discovery in Multi-Isotope Imaging Mass Spectrometry (MIMS) in Cancer Research
Greg McMahon, Principal Research Scientist, National Physical Laboratory (UK)
12:50 - 13:35 CET
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A Practical Road Map for Implementing Industry 4.0 Using Custom SQL Databases and JMP® 15
Joseph Beauchemin, Jr., Director of Quality (Non-Ferrous), Hitchiner Manufacturing
Philip Ramsey, Principal Lecturer, University of New Hampshire; and Owner, North Haven Group
13:45 - 14:15 CET
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Measurement Systems Analysis for Curve Data
Astrid Ruck, Senior Specialist in Statistics, Autoliv
Christopher Gotwalt, JMP Director of Statistical Research and Development, SAS
Laura Lancaster, JMP Principal Research Statistician Developer, SAS
14:20 - 14:50 CET
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Simple Process Monitoring of Multiple Parameters Using JMP®
Torsten Weber, Engineer Process Integration, Heliatek
15:00 - 16:00 CET
Plenary
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The Art of Statistics
David Spiegelhalter, University of Cambridge